Agilent’s FPGA dynamic probe provides greater
real-time measurement productivity for MSO-based
validation of FPGAs and the surrounding system.
The tool features:
? Increased visibility —Traditional probing limits
engineers to measuring signals at the periphery
of the FPGA. With Agilent’s FPGA dynamic
probe, engineers are able to measure up to 256
internal FPGA signals for each external FPGA pin
dedicated to debug.
? Faster probing changes — Agilent’s FPGA
dynamic probe enables your design team to move
probe points internal to the FPGA with a mouse
click — without any design changes and without
any changes to the timing of your design.
? Automatic setup of the MSO — The FPGA dynamic
probe maps internal signal names from your
FPGA design tool to the labels on your MSO
digital channels. The signal-naming capability of
the Agilent FPGA probe eliminates mistakes and
saves you the time it would take to manually set
up signal and bus names and MSO digital channel
connections, providing a significant advantage
over instruments without this capability.