資料介紹
Progress in microelectronics over the last several decades has been intimately
linked to our ability to accurately measure, model, and predict the physical
properties of solid-state electronic devices. This ability is currently endangered
by the manufacturing and fundamental limitations of nanometer scale
technology, that result in increasing unpredictability in the physical properties
of semiconductor devices. Recent years have seen an explosion of interest
in Design for Manufacturability (DFM) and in statistical design techniques.
This interest is directly attributed to the difficulties of manufacturing of integrated circuits in nanometer scale CMOS technologies with high functional
and parametric yield.
The scaling of CMOS technologies brought about the increasing magnitude
of variability of key parameters affecting the performance of integrated
circuits. The large variation can be attributed to several factors. The first is
the rise of multiple systematic sources of parameter variability caused by the
interaction between the manufacturing process and the design attributes. For
example, optical proximity effects cause polysilicon feature sizes to vary depending on the local layout surroundings, while copper wire thickness strongly
depends on the local wire density because of chemical-mechanical polishing.
The second is that while technology scaling reduces the nominal values of
key process parameters, such as effective channel length, our ability to correspondingly improve manufacturing tolerances, such as mask fabrication errors
and mask overlay control, is limited. This results in an increase in the relative
amount of variations observed. The third, and most profound, reason for
the future increase in parametric variability is that technology is approaching
the regime of fundamental randomness in the behavior of silicon structures.
For example, the shrinking volume of silicon that forms the channel of the
MOS transistor will soon contain a small countable number of dopant atoms.
Because the placement of these dopant atoms is random, the final number of
atoms that end up in the channel of each transistor is a random variable. Thus,
the threshold voltage of the transistor, which is determined by the number
of dopant atoms, will also exhibit significant variation, eventually leading to
variation in circuit-level performances, such as delay and power.
- 焊點(diǎn)統(tǒng)計(jì)
- 可制造性分析
- dfm可制造性設(shè)計(jì)
- dfm可制造性是什么
- dfm可制造性分析軟件
- dfm可制造性設(shè)計(jì)什么意思
- dfm可制造性分析
- 華秋DFM-國(guó)內(nèi)首款免費(fèi)PCB設(shè)計(jì)可制造性分析軟件 14次下載
- PCB可制造性設(shè)計(jì)分析軟件 0次下載
- PCB可制造性設(shè)計(jì)分析軟件 0次下載
- 7大妨礙PCB可制造性的主要DFM問題資料下載
- PCB設(shè)計(jì)DFM可制造性設(shè)計(jì) 0次下載
- PCB設(shè)計(jì)的可制造性 0次下載
- PCB設(shè)計(jì)的可制造性 0次下載
- 納米工藝可制造性設(shè)計(jì)EDA技術(shù)
- DFX可制造性設(shè)計(jì)與組裝技術(shù) 873次閱讀
- PCB生產(chǎn)制造前需要注意的DFM可制造性問題 1827次閱讀
- PCB設(shè)計(jì)的可制造性和可組裝性 1068次閱讀
- 可制造性、可靠性和可測(cè)性協(xié)同設(shè)計(jì) 3213次閱讀
- PCB可制造性設(shè)計(jì)和PCBA可組裝性設(shè)計(jì) 2222次閱讀
- 印制電路板貼片加工的可制造性分析 2532次閱讀
- SMT印制板可制造性設(shè)計(jì)實(shí)施步驟有哪些 3129次閱讀
- 可制造性設(shè)計(jì)DFM在PCB設(shè)計(jì)中的應(yīng)用優(yōu)勢(shì) 2954次閱讀
- 可制造性分析技術(shù)的作用及特點(diǎn)分析 6225次閱讀
- 表面組裝元器件的可焊性和耐焊性的檢測(cè)方法 1.1w次閱讀
- 妨礙PCB可制造性的七個(gè)DFM問題解析 1492次閱讀
- 可焊性的目的與分類及影響可焊性的因素 1.1w次閱讀
- PCB可制造性設(shè)計(jì)的過程方法及意義 3660次閱讀
- PCB設(shè)計(jì)的可測(cè)試性的2個(gè)部分解析 4261次閱讀
- FPGA可測(cè)性設(shè)計(jì)的“大數(shù)據(jù)”原理 1215次閱讀
下載排行
本周
- 1電子電路原理第七版PDF電子教材免費(fèi)下載
- 0.00 MB | 1490次下載 | 免費(fèi)
- 2單片機(jī)典型實(shí)例介紹
- 18.19 MB | 92次下載 | 1 積分
- 3S7-200PLC編程實(shí)例詳細(xì)資料
- 1.17 MB | 27次下載 | 1 積分
- 4筆記本電腦主板的元件識(shí)別和講解說明
- 4.28 MB | 18次下載 | 4 積分
- 5開關(guān)電源原理及各功能電路詳解
- 0.38 MB | 10次下載 | 免費(fèi)
- 6基于AT89C2051/4051單片機(jī)編程器的實(shí)驗(yàn)
- 0.11 MB | 4次下載 | 免費(fèi)
- 7藍(lán)牙設(shè)備在嵌入式領(lǐng)域的廣泛應(yīng)用
- 0.63 MB | 3次下載 | 免費(fèi)
- 89天練會(huì)電子電路識(shí)圖
- 5.91 MB | 3次下載 | 免費(fèi)
本月
- 1OrCAD10.5下載OrCAD10.5中文版軟件
- 0.00 MB | 234313次下載 | 免費(fèi)
- 2PADS 9.0 2009最新版 -下載
- 0.00 MB | 66304次下載 | 免費(fèi)
- 3protel99下載protel99軟件下載(中文版)
- 0.00 MB | 51209次下載 | 免費(fèi)
- 4LabView 8.0 專業(yè)版下載 (3CD完整版)
- 0.00 MB | 51043次下載 | 免費(fèi)
- 5555集成電路應(yīng)用800例(新編版)
- 0.00 MB | 33562次下載 | 免費(fèi)
- 6接口電路圖大全
- 未知 | 30320次下載 | 免費(fèi)
- 7Multisim 10下載Multisim 10 中文版
- 0.00 MB | 28588次下載 | 免費(fèi)
- 8開關(guān)電源設(shè)計(jì)實(shí)例指南
- 未知 | 21539次下載 | 免費(fèi)
總榜
- 1matlab軟件下載入口
- 未知 | 935053次下載 | 免費(fèi)
- 2protel99se軟件下載(可英文版轉(zhuǎn)中文版)
- 78.1 MB | 537791次下載 | 免費(fèi)
- 3MATLAB 7.1 下載 (含軟件介紹)
- 未知 | 420026次下載 | 免費(fèi)
- 4OrCAD10.5下載OrCAD10.5中文版軟件
- 0.00 MB | 234313次下載 | 免費(fèi)
- 5Altium DXP2002下載入口
- 未知 | 233045次下載 | 免費(fèi)
- 6電路仿真軟件multisim 10.0免費(fèi)下載
- 340992 | 191183次下載 | 免費(fèi)
- 7十天學(xué)會(huì)AVR單片機(jī)與C語(yǔ)言視頻教程 下載
- 158M | 183277次下載 | 免費(fèi)
- 8proe5.0野火版下載(中文版免費(fèi)下載)
- 未知 | 138039次下載 | 免費(fèi)
評(píng)論