Introduction
Manufacturing test engineers
often face the challenge of testing
multiple UUT’s (Units Under
Test) on a single functional test
system. Testing a single UUT
functionally is hard enough,
and testing more than one UUT
on a single test system simply
adds to the problem. Even so,
there are often good reasons
to test multiple UUT’s at once.
Sometimes there is a requirement
to do s for example, modern
PCB manufacturing often results
in multiple boards physically
built on the same panel for
reasons of cost. In this case,
the test system needs to be able
to deal with multiple UUT’s.
Testing multiple UUT’s at once
can also frequently help reduce
the cost of test equipment
requiredto match a particular
manufacturing capacity by
increasing test throughput per
UUT and increasing test system
utilization.